• Photonic-chip assisted correlative light and electron microscopy 

      Tinguely, Jean-Claude; Steyer, Anna Maria; Øie, Cristina Ionica; Helle, Øystein Ivar; Dullo, Firehun Tsige; Olsen, Randi; McCourt, Peter; Schwab, Yannick; Ahluwalia, Balpreet Singh (Journal article; Tidsskriftartikkel; Peer reviewed, 2020-12-07)
      Correlative light and electron microscopy (CLEM) unifies the versatility of light microscopy (LM) with the high resolution of electron microscopy (EM), allowing one to zoom into the complex organization of cells. Here, we introduce photonic chip assisted CLEM, enabling multi-modal total internal reflection fluorescence (TIRF) microscopy over large field of view and high precision localization of the ...